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An electrodynamic coaxial spectrometer for multichannel plasma pulse analysisEICHER, J; ROHR, K; WEBER, H et al.Journal of physics. E. Scientific instruments. 1983, Vol 16, Num 9, pp 903-908, issn 0022-3735Article

A transversally and longitudinally focusing time-of-flight mass spectrometerKUTSCHER, R; GRIX, R; LI, G et al.International journal of mass spectrometry and ion processes. 1991, Vol 103, Num 2-3, pp 117-128, issn 0168-1176Article

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Operation and mass resolution of a time-of-flight mass spectrometer with electron impact ionization and rapid field reversalHOLMLID, L.International journal of mass spectrometry and ion processes. 1984, Vol 59, Num 3, pp 247-259Article

Tandem quadrupole/time-of-flight instrument for mass spectrometry/mass spectrometryGLISH, G. L; GOERINGER, D. E.Analytical chemistry (Washington, DC). 1984, Vol 56, Num 13, pp 2291-2295, issn 0003-2700Article

Post source pulse focusing: a simple method to achieve improved resolution in a time-of-flight mass spectrometerKINSEL, G. R; JOHNSTON, M. V.International journal of mass spectrometry and ion processes. 1989, Vol 91, Num 2, pp 157-176, issn 0168-1176Article

Résolution d'un spectromètre de diffusion de neutrons aux petits angles = Resolution of neutrons diffusion spectrometer on small anglesLAIREZ, D.Journal de physique. IV. 1999, Vol 9, Num 1, pp Pr1.67-Pr1.81, issn 1155-4339Conference Paper

Improving the sensitivity of the end-cap reflectron time-of-flight mass spectrometerFANCHER, C. A; WOODS, A. S; COTTER, R. J et al.Journal of mass spectrometry. 2000, Vol 35, Num 2, pp 157-162, issn 1076-5174Article

Space-resolved analysis of highly charged radiating target ions generated by kilojoule laser beamsROSMEJ, F. B; RENNER, O; ROSMEJ, O. N et al.Laser and particle beams (Print). 2002, Vol 20, Num 4, pp 555-557, issn 0263-0346, 3 p.Conference Paper

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Double ionization of O₂ by electron impactCHO, H; LEE, S. H.Physical review. A. 1993, Vol 48, Num 3, pp 2468-2470, issn 1050-2947, AArticle

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Evidence of a nonthermal mechanism for ejection of ions and neutrals during excimer laser ablation of GeSOLIS, J; VEGA, F; AFONSO, C. N et al.Journal of applied physics. 1993, Vol 74, Num 6, pp 4271-4273, issn 0021-8979Article

Secondary electron coincidence detection and time of flight spectroscopyMULLEJANS, H; BLELOCH, A. L; HOWIE, A et al.Ultramicroscopy. 1993, Vol 52, Num 3-4, pp 360-368, issn 0304-3991Conference Paper

Low-energy neutral particle analysis by a time-of-flight method on JFT-2MMIURA, Y; OKANO, F.Review of scientific instruments. 1990, Vol 61, Num 11, pp 3581-3585, issn 0034-6748Article

Time-of-flight mass spectrometry: an increasing role in the life sciencesCOTTER, R. J.Biomedical & environmental mass spectrometry. 1989, Vol 18, Num 8, pp 513-532, issn 0887-6134Article

Laser desorption time-of-flight mass spectrometry of high mass moleculesTABET, J.-C; COTTER, R. J.Analytical chemistry (Washington, DC). 1984, Vol 56, Num 9, pp 1662-1667, issn 0003-2700Article